mahdieh11

Pattern recognition with moment invariants: A comparative study and new results

•S.O. Belkasim,
•M. Shridhar,
•M. Ahmadi


• Department of Electrical Engineering, University of Windsor, Windsor, Ontario, N9B 3P4, Canada

Received 22 November 1989Revised 3 May 1991Accepted 15 May 1991Available online 19 May 2003
•http://dx.doi.org/10.1016/0031-3203(91)90140-Z, How to Cite or Link Using DOI


•Permissions & Reprints


http://www.sciencedirect.com/science...3132039190140Z

nazliii

PATTERN.pdf | Filepak

خدمت شما.

glinboy

سلام
میتونید استاندارد زیر رو هم به من بدید:
IEEE Standard Test Access Port and Boundary-Scan Architecture

IEEE Xplore - IEEE Std 1149.1-2001

این استاندارد در مورد رابط JTAG میباشد.

ebtehaj

salam
maghaleyi ke khaste budin.

فايل ضميمه

IEEE Standard Test Access Port and Boundary-Scan Architecture.pdf (1.40 مگابايت, 18 نمايش)

glinboy

متشکرم؛
میتونید این ها رو هم برام بگیرید:
1149.7-2009 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
IEEE Xplore - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architec...

Hidden semi-Markov models
ScienceDirect.com - Artificial Intelligence - Hidden semi-Markov models

ebtehaj

اینم مقالات درخواستی :

پرشین گیگ - دانلود - ieee.zip