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Pattern recognition with moment invariants: A comparative study and new results
•S.O. Belkasim, •M. Shridhar, •M. Ahmadi • Department of Electrical Engineering, University of Windsor, Windsor, Ontario, N9B 3P4, Canada Received 22 November 1989Revised 3 May 1991Accepted 15 May 1991Available online 19 May 2003 •http://dx.doi.org/10.1016/0031-3203(91)90140-Z, How to Cite or Link Using DOI •Permissions & Reprints http://www.sciencedirect.com/science...3132039190140Z |
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میتونید استاندارد زیر رو هم به من بدید: IEEE Standard Test Access Port and Boundary-Scan Architecture IEEE Xplore - IEEE Std 1149.1-2001 این استاندارد در مورد رابط JTAG میباشد. |
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